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dc.contributorDjahèi F.
dc.creatorMahamdi Ramdane
dc.date.accessioned2016-11-14T13:15:56Z
dc.date.issued2017-01-01
dc.identifierhttp://bu.umc.edu.dz/md/index.php?lvl=notice_display&id=2370
dc.identifier2370
dc.identifier20110124u u u0frey50 ba
dc.identifier.urihttp://hdl.handle.net/123456789/8905
dc.description120 f.
dc.languagefre
dc.subjectElectronique
dc.titleModélisation des mécanismes de dégradation de l'interface Si/SiO2 des transistors MOS
dc.coverage1 Disponible à la salle de recherche 2 Disponibles au magasin de la bibliothèque centrale


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