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dc.contributor.authorKHECHBA, M
dc.contributor.authorHANINI, F
dc.contributor.authorBOUABELLOU, A
dc.date.accessioned2017-06-15T11:24:38Z
dc.date.available2017-06-15T11:24:38Z
dc.date.issued2013-12-16
dc.identifier.urihttp://hdl.handle.net/123456789/135579
dc.description.abstractCadmium doped tin oxide thin films were deposited by sol–gel dip-coated (SGDC) method on glass and Si (100) substrates at room temperature and then annealed at 550°C in air. The influence of the Cd concentration on the morphology and microstructure of the Cd -doped SnO2 films was studied using X-ray diffraction (XRD), atomic force microscopy (AFM) and UV–Vis spectrophotometry techniques. The single-phase rutile is evidenced by XRD analysis. Both AFM observations and optical measurements show that the surface morphology and the energy band gap depend on the Cd doping levelfr_FR
dc.language.isoenfr_FR
dc.publisherUniversité des Frères Mentouri Constantinefr_FR
dc.subjectsol–gelfr_FR
dc.subject(SGDC)fr_FR
dc.subjectSnO2fr_FR
dc.titleCHARACTERISTICS OF CD DOPED SnO2 THIN FILMS FABRICATION BY SOL-GEL METHODfr_FR
dc.typeArticlefr_FR


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