CHARACTERISTICS OF CD DOPED SnO2 THIN FILMS FABRICATION BY SOL-GEL METHOD

Abstract

Cadmium doped tin oxide thin films were deposited by sol–gel dip-coated (SGDC) method on glass and Si (100) substrates at room temperature and then annealed at 550°C in air. The influence of the Cd concentration on the morphology and microstructure of the Cd -doped SnO2 films was studied using X-ray diffraction (XRD), atomic force microscopy (AFM) and UV–Vis spectrophotometry techniques. The single-phase rutile is evidenced by XRD analysis. Both AFM observations and optical measurements show that the surface morphology and the energy band gap depend on the Cd doping level