Now showing items 1-2 of 2

    • ATOMIC FORCE AND TUNNEL MICROSCOPY OF ALUMINUM NANOISLANDS 

      Nedilko, S; Prorok, V; Rozouvan, S; Aigouy, L (Université des Frères Mentouri Constantine, 2013-02-17)
      Scanning atomic force microscopy (AFM) and scanning tunneling microscopy (TM) were proven to be extremely useful experimental techniques for characterization of thin films on metal or semiconductor substrate. The technique ...
    • PROPERTIES AND NATURE OF SOME BI-CONTAINING PHOSPHATE/MOLYBDATE COMPOUNDS LUMINESCENCEAND ITS POSSIBLE APPLICATIONS 

      Chornii, V; Hizhnyi, Yu; Nedilko, S; Zatovsky, I; Terebilenko, K; Boyko, V; Sheludko, V; Aigouy, L (Université des Frères Mentouri Constantine, 2013-02-17)
      Bismuth phosphates/molybdates and alkali metal both undoped and doped with luminescent ions have attracted much attention last decade due to their practical applications as effective components for white light emission ...