Abstract:
In this work Al doped ZnO thin films were deposited on the silicium substrates by a
dip coating sol–gel technique. The influences of annealing temperature on the structural and
optical properties of aluminum doped ZnO (AZO) films were investigated. The structural
properties of the ZnO films such as surface morphology and crystallinity were determined
scanning electron microscopy (SEM) and X-ray diffractometry (XRD), respectively. The optical
properties of the ZnO films were characterized by the photoluminescence spectroscopy. The
experimental results reveal that the thermal annealing treatment affects the properties of
the ZnO films
