PROPERTIES OF PASSIVE FILMS FORMED ON TIN IN SODIUM SULFIDE AND SODIUM HYDROXIDE SOLUTION BY EIS

dc.contributor.author	KABOUCHE, Said
dc.contributor.author	KAIZRA, Salima
dc.contributor.author	LOUAFI, Yamina
dc.contributor.author	TRARI, M
dc.date.accessioned	2022-05-30T10:04:34Z
dc.date.available	2022-05-30T10:04:34Z
dc.date.issued	2016-10-31
dc.identifier.uri	http://depot.umc.edu.dz/handle/123456789/12373
dc.description.abstract	Passive films formed anodically on tin, in 0.5 M NaOH and in 0.5 M Na2S have been characterised by electrochemical impedance spectroscopy (EIS) and cyclic potentiodynamic polarization. The observation of the film formed at surface was done by scanning electron microscopy. In bothes cases the semiconductor properties of the passive films were investigated by Mott/Schottky plots. The two passive films exhibit n-type semiconductor behavior. It was seen the differences is found concerning thickness of the space charge region and the second in the concentration of donors
dc.language.iso	en
dc.publisher	Université Frères Mentouri - Constantine 1
dc.subject	SnS
dc.subject	SnO
dc.subject	Passivation
dc.subject	Electrochemical impedance spectroscopy
dc.subject	Semiconductor properties
dc.title	PROPERTIES OF PASSIVE FILMS FORMED ON TIN IN SODIUM SULFIDE AND SODIUM HYDROXIDE SOLUTION BY EIS
dc.type	Article